Lens-integrated asymmetric-dual-grating-gate high-electron-mobility-transistor for plasmonic terahertz detection

T. Hosotani, F. Kasuya, H. Taniguchi, Takayuki Watanabe, T. Suemitsu, T. Otsuji, T. Ishibashi, M. Shimizu, A. Satou
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引用次数: 2

Abstract

Asymmetric-dual-grating-gate high-electron-mobility-transistors (ADGG-HEMTs) are expected for high responsivity, room-temperature operating, and high-speed THz detectors. However, their low light coupling efficiency is one of the serious concerns because of the large focused spot size of free-space THz waves. To improve this, we examine shrinking the THz wave spot size by integrating a detector with a hyper-hemispherical silicon lens. We report the 6-fold enhancement of the coupling efficiency by the silicon lens integration. Also, we show that the dependence of the detector module responsivity on incident THz wave frequency is given by the product of the internal responsivity of ADGG-HEMTs and the light coupling efficiency owing to the silicon lens.
用于等离子体太赫兹探测的透镜集成非对称双栅极高电子迁移率晶体管
非对称双栅栅高电子迁移率晶体管(adgg - hemt)有望用于高响应、室温工作和高速太赫兹探测器。然而,由于自由空间太赫兹波的聚焦光斑尺寸大,其低光耦合效率是一个严重的问题。为了改善这一点,我们研究了通过将探测器与超半球面硅透镜集成来缩小太赫兹波光斑的大小。我们报告了硅透镜集成的耦合效率提高了6倍。此外,我们还证明了探测器模块响应率与入射太赫兹波频率的关系是由adgg - hemt的内部响应率与硅透镜的光耦合效率的乘积给出的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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