I. Slauch, Saurabh Vishwakarma, J. Tracy, W. Gambogi, R. Meier, Farhan Rahman, James Y. Hartley, M. Bertoni
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引用次数: 2
Abstract
The architecture of a photovoltaic module directly influences its mechanical stability, affecting cell crack propagation and contributing to the existence and distribution of stresses. Herein, we evaluate cell deflection using X-Ray Topography (XRT) and compare resulting stresses using both thin-plate theory and Finite Element Analysis (FEA). Countering the common belief, we show that glass/glass module architectures exhibit higher bending induced cell stresses during module fabrication. These residual stresses superimpose with stresses experienced in the field and may lead to more frequent cell breakage.