Effect of pH on the Structural and Optical Properties of Cadmium oxide Thin Films Prepared Using the Successive Ionic Layer Adsorption and Reaction (SILAR) Method

F. K. Jawad, Nathera A. Al-tememee
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Abstract

Cadmium oxide (CdO) thin films were deposited using the sequencing ion layer adsorption and reaction (SILAR) method. In this study, the effect of the pH value of an aqueous solution of cadmium acetate at a concentration of 0.2 mol of the cadmium oxide film was determined. The solution source for the cadmium oxide film was cadmium ions and an aqueous ammonia solution. The CdO films were deposited on glass substrates at a temperature of 90 ℃. The cadmium oxide film thickness was determined by the weight difference method at pH values ​​(7.2, 8.2). X-ray diffraction (XRD) and scanning electron microscopy (SEM) showed that the size of the crystals increased with the increase in the solution (pH). While the UV-visible spectra of the films revealed that the optical band gap energy decreases with increasing (pH) of the CdO solution. The absorbance spectrum of the cadmium oxide film was recorded in the wavelength range (300 – 900) nm. The change in the pH of the cadmium acetate aqueous solution from the energy gap and X-ray diffraction calculations showed that the film had an optical band gap energy and that the highest intensity was at (111) and that the membrane is n-type, as shown by studies to prepare the cadmium oxide membrane using the SILAR method.
pH对连续离子层吸附反应(SILAR)法制备氧化镉薄膜结构和光学性能的影响
采用顺序离子层吸附反应(SILAR)法制备了氧化镉(CdO)薄膜。在本研究中,测定了0.2 mol氧化镉膜浓度下醋酸镉水溶液pH值的影响。镉氧化膜的溶液来源为镉离子和氨水溶液。在90℃的温度下,将CdO薄膜沉积在玻璃衬底上。在pH值(7.2,8.2)下,用重量差法测定氧化镉膜厚度。x射线衍射(XRD)和扫描电镜(SEM)分析表明,晶体尺寸随溶液pH的增加而增大。膜的紫外可见光谱显示,带隙能量随溶液pH值的增加而减小。记录了氧化镉膜在300 ~ 900 nm波长范围内的吸光度光谱。从能隙和x射线衍射计算醋酸镉水溶液pH值的变化可知,膜具有光学带隙能量,最高强度在(111)处,膜为n型,采用SILAR方法制备氧化镉膜的研究表明。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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