Effect of the Crystal Alignment and Grain Size on the Thermoelectric Properties of Bi 0.4Sb 1.6Te 3 Sintered Materials

A. Suzuki, H. Kitagawa, A. H. Pham, S. Morito, K. Kikuchi
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Abstract

Sintered polycrystalline Bi0.4Sb1.6Te3 thermoelectric materials with various degrees of crystal alignment and grain sizes were prepared by pulse-current sintering under cyclic uniaxial pressure at sintering temperatures of 350–425 °C for holding times of 0–60 min to clarify the relationship between the microstructure and the thermoelectric properties. The degree of crystal alignment was enhanced with an increase of both the sintering temperature and holding time, and grain growth was also confirmed in the high temperature or long-time sintering process. The thermoelectric properties were measured perpendicular to the pressing direction, which corresponds to the crystal alignment direction. The electrical resistivity decreased and the thermal conductivity slightly increased with increasing sintering temperature and holding time. As a result, the figures of merit of the crystal-aligned samples sintered at high temperatures or for long holding times tended to reach 0.9–1 with large power factors because of the small electrical resistivity. The relationships between the quantified microstructure parameters and thermoelectric properties are discussed. The electrical resistivity decreased with increasing degree of crystal alignment and it saturated at a certain degree of crystal alignment, indicating that perfect crystal alignment is not necessary to obtain the lower limit of the electrical resistivity. Conversely, no significant change of the lattice thermal conductivity was observed in the grain size range 0.6–9.7 μm. This means that the lattice thermal conductivity of crystal aligned Bi0.4Sb1.6Te3 is almost independent of the degree of crystal alignment and grain size in the measured range.
晶体取向和晶粒尺寸对bi0.4 sb 1.6Te 3烧结材料热电性能的影响
在350 ~ 425℃的烧结温度和0 ~ 60 min的保温时间下,采用循环单轴压力脉冲烧结法制备了具有不同晶粒取向和晶粒大小的Bi0.4Sb1.6Te3多晶热电材料,以阐明其微观结构与热电性能之间的关系。随着烧结温度和保温时间的增加,晶粒的排列程度增强,在高温或长时间烧结过程中晶粒的生长也得到了证实。在与晶体取向方向相对应的垂直方向上测量了热电性能。随着烧结温度和保温时间的增加,材料的电阻率降低,导热系数略有增加。结果表明,由于电阻率小,在高温或长时间保温下烧结的晶体排列样品的优点系数往往达到0.9-1,功率因数较大。讨论了量化的微观结构参数与热电性能之间的关系。电阻率随晶体排列程度的增加而降低,并在晶体排列到一定程度时达到饱和,说明无需完全排列晶体即可获得电阻率的下限。相反,在0.6 ~ 9.7 μm晶粒范围内,晶格导热系数无明显变化。这意味着在测量范围内,Bi0.4Sb1.6Te3取向晶体的晶格导热系数几乎与晶体取向程度和晶粒尺寸无关。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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