Runtime verification of nonlinear analog circuits using incremental Time-augmented RRT algorithm

S. Ahmadyan, Jayanand Asok Kumar, Shobha Vasudevan
{"title":"Runtime verification of nonlinear analog circuits using incremental Time-augmented RRT algorithm","authors":"S. Ahmadyan, Jayanand Asok Kumar, Shobha Vasudevan","doi":"10.7873/DATE.2013.019","DOIUrl":null,"url":null,"abstract":"Because of complexity of analog circuits, their verification presents many challenges. We propose a runtime verification algorithm to verify design properties of nonlinear analog circuits. Our algorithm is based on performing exploratory simulations in the state-time space using the Time-augmented Rapidly Exploring Random Tree (TRRT) algorithm. The proposed runtime verification methodology consists of i) incremental construction of the TRRT to explore the state-time space and ii) use of an incremental online monitoring algorithm to check whether or not the incremented TRRT satisfies or violates specification properties at each iteration. In comparison to the Monte Carlo simulations, for providing the same state-space coverage, we utilize a logarithmic order of memory and time.","PeriodicalId":6310,"journal":{"name":"2013 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"25 1","pages":"21-26"},"PeriodicalIF":0.0000,"publicationDate":"2013-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 Design, Automation & Test in Europe Conference & Exhibition (DATE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.7873/DATE.2013.019","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8

Abstract

Because of complexity of analog circuits, their verification presents many challenges. We propose a runtime verification algorithm to verify design properties of nonlinear analog circuits. Our algorithm is based on performing exploratory simulations in the state-time space using the Time-augmented Rapidly Exploring Random Tree (TRRT) algorithm. The proposed runtime verification methodology consists of i) incremental construction of the TRRT to explore the state-time space and ii) use of an incremental online monitoring algorithm to check whether or not the incremented TRRT satisfies or violates specification properties at each iteration. In comparison to the Monte Carlo simulations, for providing the same state-space coverage, we utilize a logarithmic order of memory and time.
非线性模拟电路运行时验证使用增量时间增强RRT算法
由于模拟电路的复杂性,其验证提出了许多挑战。我们提出了一种运行时验证算法来验证非线性模拟电路的设计特性。我们的算法基于使用时间增强快速探索随机树(TRRT)算法在状态时间空间中进行探索性模拟。提出的运行时验证方法包括i)增量构造TRRT以探索状态-时间空间和ii)使用增量在线监控算法来检查增量TRRT在每次迭代中是否满足或违反规范属性。与蒙特卡罗模拟相比,为了提供相同的状态空间覆盖,我们利用了对数级的内存和时间。
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