A new method for the determination of stress-strain curves on thin electroplated layers

Ch.J. Raub, J. Lendvay
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Abstract

Stress-strain curves are obtained for hard gold deposits electroplated onto soft gold wires. The strenth of the substrate wire is too low to contribute significantly to the behaviour of the composite specimens. The method avoids a number of possible artefacts and is useful for testing the quality of electrolytes and deposits. Application to other metals in anticipated.

一种测定薄电镀层应力-应变曲线的新方法
得到了软金丝上镀硬金的应力-应变曲线。基体金属丝的强度太低,对复合材料试样的性能影响不大。该方法避免了许多可能的伪影,对测试电解质和沉积物的质量很有用。可应用于其它金属。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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