Application of cepstral analysis to thin beds

Chun-yuan LIU , Sheng-feng XU , Jian-hua YUE , Xiu-cheng WEI
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引用次数: 3

Abstract

This paper provides a detailed description of the cepstrum and its application to computing the thickness of thin beds. By building several models, including models with a single reflection pair, a single layer, wedge model and multi-layered models, and comparing the cepstrum computed for all of them to the actual spacing values we conclude that the results of cepstral analysis are more accurate in predicting the thickness of the thin bed structures.

倒谱分析在薄层中的应用
本文详细介绍倒谱及其在计算薄层厚度中的应用。通过建立单反射对模型、单层模型、楔形模型和多层模型,并将各模型计算的倒谱与实际间距值进行比较,得出倒谱分析结果在预测薄层构造厚度方面更为准确的结论。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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