A Study of Coulomb Explosion Induced by Freestanding Carbon Nanotube During Field Emission

J. Liu, Yonghai Sun, Siyuan Chen, E. Cheraghi, Jiaqi Wang, Zhemiao Xie, J. Yeow
{"title":"A Study of Coulomb Explosion Induced by Freestanding Carbon Nanotube During Field Emission","authors":"J. Liu, Yonghai Sun, Siyuan Chen, E. Cheraghi, Jiaqi Wang, Zhemiao Xie, J. Yeow","doi":"10.1109/NANO51122.2021.9514323","DOIUrl":null,"url":null,"abstract":"Low-density patterned Carbon Nanotube (CNT) field emitter is important for applications that require an addressable electron emission source. However, coulomb explosion, that occurs on freestanding CNTs when coulomb repulsion exceeds the limit of van der Waals force, will be induced by low-density patterned CNT field emitters. The coulomb explosion is the main reason cause the short lifetime of low-density patterned CNT field emitters and the direct failure of the CNT field emission (FE) process by inducing a strong arcing between CNT cathode and Indium tin oxide (ITO) anode. Therefore, study the phenomenon of CNT FE induced coulomb explosion and the causes are the keys to increase the lifetime and stability of low-density patterned CNT field emitters.","PeriodicalId":6791,"journal":{"name":"2021 IEEE 21st International Conference on Nanotechnology (NANO)","volume":"23 1","pages":"27-30"},"PeriodicalIF":0.0000,"publicationDate":"2021-07-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE 21st International Conference on Nanotechnology (NANO)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NANO51122.2021.9514323","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Low-density patterned Carbon Nanotube (CNT) field emitter is important for applications that require an addressable electron emission source. However, coulomb explosion, that occurs on freestanding CNTs when coulomb repulsion exceeds the limit of van der Waals force, will be induced by low-density patterned CNT field emitters. The coulomb explosion is the main reason cause the short lifetime of low-density patterned CNT field emitters and the direct failure of the CNT field emission (FE) process by inducing a strong arcing between CNT cathode and Indium tin oxide (ITO) anode. Therefore, study the phenomenon of CNT FE induced coulomb explosion and the causes are the keys to increase the lifetime and stability of low-density patterned CNT field emitters.
场发射过程中独立碳纳米管诱发库仑爆炸的研究
低密度图案化碳纳米管(CNT)场发射体对于需要可寻址电子发射源的应用非常重要。然而,当库仑斥力超过范德华力的极限时,在独立式碳纳米管上发生的库仑爆炸,将由低密度图纹碳纳米管场发射体引起。库仑爆炸是导致低密度图像化碳纳米管场致发射体寿命短的主要原因,并通过在碳纳米管阴极和氧化铟锡阳极之间诱发强电弧直接破坏了碳纳米管场致发射过程。因此,研究碳纳米管FE诱发库仑爆炸现象及其原因是提高低密度图像化碳纳米管场致发射体寿命和稳定性的关键。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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