RF-PUF: IoT security enhancement through authentication of wireless nodes using in-situ machine learning

Baibhab Chatterjee, D. Das, Shreyas Sen
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引用次数: 35

Abstract

Physical unclonable functions (PUF) in silicon exploit die-to-die manufacturing variations during fabrication for uniquely identifying each die. Since it is practically a hard problem to recreate exact silicon features across dies, a PUF-based authentication system is robust, secure and cost-effective, as long as bias removal and error correction are taken into account. In this work, we utilize the effects of inherent process variation on analog and radio-frequency (RF) properties of multiple wireless transmitters (Tx) in a sensor network, and detect the features at the receiver (Rx) using a deep neural network based framework. The proposed mechanism/ framework, called RF-PUF, harnesses already-existing RF communication hardware and does not require any additional PUF-generation circuitry in the Tx for practical implementation. Simulation results indicate that the RF-PUF framework can distinguish up to 10000 transmitters (with standard foundry defined variations for a 65 nm process, leading to non-idealities such as LO offset and I-Q imbalance) under varying channel conditions, with a probability of false detection < 10−3.
RF-PUF:通过使用原位机器学习对无线节点进行认证来增强物联网安全性
硅中的物理不可克隆功能(PUF)在制造过程中利用模具到模具的制造变化来唯一地识别每个模具。由于在芯片上重建精确的硅特征实际上是一个难题,因此只要考虑到消除偏置和纠错,基于puf的认证系统就具有鲁棒性,安全性和成本效益。在这项工作中,我们利用固有过程变化对传感器网络中多个无线发射器(Tx)的模拟和射频(RF)特性的影响,并使用基于深度神经网络的框架检测接收器(Rx)的特征。所提出的机制/框架,称为RF- puf,利用已经存在的RF通信硬件,并且不需要在Tx中额外的puf生成电路进行实际实施。仿真结果表明,RF-PUF框架可以在不同信道条件下区分多达10000个发射机(对于65nm工艺,标准铸造厂定义的变化会导致LO偏移和I-Q不平衡等非理想情况),误检概率< 10−3。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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