Angular and impact energy dependence of intensity ratio of Kα,β x-rays to bremsstrahlung radiation emitted from 10-25 keV electrons incident on a pure thick Cu (Z=29) target

S. Prajapati, Bhupendra Singh, B. Singh, X. Llovet, R. Shanker
{"title":"Angular and impact energy dependence of intensity ratio of Kα,β x-rays to bremsstrahlung radiation emitted from 10-25 keV electrons incident on a pure thick Cu (Z=29) target","authors":"S. Prajapati, Bhupendra Singh, B. Singh, X. Llovet, R. Shanker","doi":"10.1063/1.5122519","DOIUrl":null,"url":null,"abstract":"The variation of relative intensity ratios of the characteristic K x-ray lines, namely, Kα and Kβ to that of the underneath BS radiation as a function of incidence angle 15°-75° under bombardment of 10-25 keV-electrons on a pure thick target of polycrystalline Cu (Z=29) in the reflection geometry mode using a Si PIN photodiode detector has been studied. The comparison of experimental results with those of MC simulations using PENELOPE code shows a good agreement between experiment and theory within the error of measurements for both angular and energy dependence of the considered ratios. The details of these results are presented and discussed in this work.The variation of relative intensity ratios of the characteristic K x-ray lines, namely, Kα and Kβ to that of the underneath BS radiation as a function of incidence angle 15°-75° under bombardment of 10-25 keV-electrons on a pure thick target of polycrystalline Cu (Z=29) in the reflection geometry mode using a Si PIN photodiode detector has been studied. The comparison of experimental results with those of MC simulations using PENELOPE code shows a good agreement between experiment and theory within the error of measurements for both angular and energy dependence of the considered ratios. The details of these results are presented and discussed in this work.","PeriodicalId":7262,"journal":{"name":"ADVANCES IN BASIC SCIENCE (ICABS 2019)","volume":"154 8 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2019-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ADVANCES IN BASIC SCIENCE (ICABS 2019)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1063/1.5122519","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

The variation of relative intensity ratios of the characteristic K x-ray lines, namely, Kα and Kβ to that of the underneath BS radiation as a function of incidence angle 15°-75° under bombardment of 10-25 keV-electrons on a pure thick target of polycrystalline Cu (Z=29) in the reflection geometry mode using a Si PIN photodiode detector has been studied. The comparison of experimental results with those of MC simulations using PENELOPE code shows a good agreement between experiment and theory within the error of measurements for both angular and energy dependence of the considered ratios. The details of these results are presented and discussed in this work.The variation of relative intensity ratios of the characteristic K x-ray lines, namely, Kα and Kβ to that of the underneath BS radiation as a function of incidence angle 15°-75° under bombardment of 10-25 keV-electrons on a pure thick target of polycrystalline Cu (Z=29) in the reflection geometry mode using a Si PIN photodiode detector has been studied. The comparison of experimental results with those of MC simulations using PENELOPE code shows a good agreement between experiment and theory within the error of measurements for both angular and energy dependence of the considered ratios. The details of these results are presented and discussed in this work.
纯厚Cu (Z=29)靶上10- 25kev电子轫致辐射的Kα,β x射线强度比与角和冲击能的关系
用Si PIN光电二极管探测器研究了在反射几何模式下,在10-25个K -电子轰击多晶Cu (Z=29)纯厚靶时,特征K射线线(Kα和Kβ)相对强度比与下BS辐射相对强度比随入射角15°~ 75°的变化规律。实验结果与PENELOPE代码MC模拟结果的比较表明,在考虑的比值的角依赖性和能量依赖性的测量误差范围内,实验和理论之间的一致性很好。这些结果的细节在本工作中被提出和讨论。用Si PIN光电二极管探测器研究了在反射几何模式下,在10-25个K -电子轰击多晶Cu (Z=29)纯厚靶时,特征K射线线(Kα和Kβ)相对强度比与下BS辐射相对强度比随入射角15°~ 75°的变化规律。实验结果与PENELOPE代码MC模拟结果的比较表明,在考虑的比值的角依赖性和能量依赖性的测量误差范围内,实验和理论之间的一致性很好。这些结果的细节在本工作中被提出和讨论。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信