Fabrication nanotips array for thermoelectric coolers using NERCOM process

IF 0.1 0 THEATER
F. Tay, C. Iliescu, H. Chua
{"title":"Fabrication nanotips array for thermoelectric coolers using NERCOM process","authors":"F. Tay, C. Iliescu, H. Chua","doi":"10.1109/SMICND.2005.1558780","DOIUrl":null,"url":null,"abstract":"This paper presents a new fabrication process for nanotips array using notching effect of reflected charges on mask (NECROM). The new fabrication process is based on two phenomenons: flowing of an AZ9260 thick photoresist mask when is baked at 120degC and the notching effect of the reflected charges from the photoresist mask in a plasma etching process. The heating of the photoresist at different temperature and time, different profile of the masking layer walls can be achieved. During the plasma etching process, the charges (ions and radicals) are reflected by the oblique profile of the masking layer walls and generate an undercut. This phenomenon was associated with an isotropic etching process in a deep RIE system to produce tips. Due to the isotropy of the process, the lips are generated. The results indicate that the radiuses of the tips are in the range of 40 to 60 nm","PeriodicalId":40779,"journal":{"name":"Teatro e Storia","volume":"1 1","pages":"285-288 vol. 2"},"PeriodicalIF":0.1000,"publicationDate":"2005-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Teatro e Storia","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMICND.2005.1558780","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"0","JCRName":"THEATER","Score":null,"Total":0}
引用次数: 0

Abstract

This paper presents a new fabrication process for nanotips array using notching effect of reflected charges on mask (NECROM). The new fabrication process is based on two phenomenons: flowing of an AZ9260 thick photoresist mask when is baked at 120degC and the notching effect of the reflected charges from the photoresist mask in a plasma etching process. The heating of the photoresist at different temperature and time, different profile of the masking layer walls can be achieved. During the plasma etching process, the charges (ions and radicals) are reflected by the oblique profile of the masking layer walls and generate an undercut. This phenomenon was associated with an isotropic etching process in a deep RIE system to produce tips. Due to the isotropy of the process, the lips are generated. The results indicate that the radiuses of the tips are in the range of 40 to 60 nm
利用NERCOM工艺制备热电冷却器纳米尖阵列
本文提出了一种利用掩膜上反射电荷的缺口效应制备纳米针尖阵列的新工艺。该工艺是基于AZ9260厚光刻膜在120℃下烘烤时的流动现象和等离子体刻蚀过程中光刻膜反射电荷的缺口效应。在不同的温度和时间对光刻胶进行加热,可以得到不同形状的掩膜层壁。在等离子体刻蚀过程中,电荷(离子和自由基)被掩蔽层壁的斜轮廓反射并产生凹边。这种现象与深RIE系统中产生尖端的各向同性蚀刻工艺有关。由于各向同性的过程,唇产生。结果表明,尖端的半径在40 ~ 60 nm之间
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
Teatro e Storia
Teatro e Storia THEATER-
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信