X-ray diffraction investigation of the relationship between strains and metal-insulator transition in NdNiO3 thin films

Abstract

The RNiO₃ perovskites (R=rare earth) are well known for their metal to insulator transition, which temperature can be modulated by changing the nature of the rare earth. It makes this family of oxides very attractive for several applications such as thermochromic coating. In this work we have studied NdNiO₃ thin films, grown on (110) NdGaO₃, single crystal substrate, with different thicknesses. The temperature of the metal to insulator transition varies in the range 150 –200 K. Residual stress in films was analyzed using the sin²ψ method. Each film exhibits in plane tensile stress, their magnitude depending on the synthesis conditions. A possible relationship between the metal-insulator transition temperature and residual stress is discussed.