Siming Li, R. Farshchi, Michael F. Miller, A. Arehart, D. Kuciauskas
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引用次数: 0
Abstract
We applied time-resolved photoluminescence (TRPL) spectroscopy to study optimized chalcopyrite (Ag,Cu)(In,Ga)Se2 thin films. The device shows power conversion efficiency of 18.7%. The metastable defect VSe-VCu within ACIGS at $\text{Ev}+0.98\ \text{eV}$ is detected in sub-bandgap TRPL excitation spectra. TRPL lifetime of 50 ns is limited by the density of mid-gap defects such as CuGaor CuIn. The similarity of TRPL dynamics before and after light soaking indicates the optimized ACIGS thin film is less metastable because the density of VCu-VSe defect is reduced to below 1015cm−3. This study indicates that ACIGS has improved cell efficiency and reliability characteristics.
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