Elimination of silicon hillocks using an alkaline complexant etching system

Carmen Moldovan, Rodica Iosub, Mircea Modreanu
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引用次数: 5

Abstract

This paper presents the results obtained in silicon hillock elimination using alkaline solutions: KOH, NaOH, LiOH·H2O with an added complexant. The added complexant in alkaline solutions is azocalix[4]arene. The alkaline solutions were compared and analysed with and without added complexant for their effect on hillocks. The behaviour of these solutions is explained using the theory of molar conductivity. The results show that use of the complexant permits control of the etching process, yielding a smooth silicon surface, almost free of hillocks. A comparison between the alkaline etchants (KOH, NaOH, LiOH·H2O) is made and the influence of the cations in silicon etching process is explained.

用碱性络合剂蚀刻系统消除硅丘
本文介绍了添加络合剂的KOH、NaOH、LiOH·H2O碱性溶液消除硅丘的结果。在碱性溶液中添加的络合剂为偶氮杯[4]芳烃。比较分析了添加络合剂和不添加络合剂的碱性溶液对丘疹的影响。这些溶液的性质可以用摩尔电导率理论来解释。结果表明,使用络合剂可以控制蚀刻过程,产生光滑的硅表面,几乎没有山丘。对碱性蚀刻剂(KOH、NaOH、LiOH·H2O)进行了比较,并说明了阳离子对硅蚀刻过程的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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