{"title":"Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)","authors":"P. Bertrand, L. Weng","doi":"10.1007/978-3-7091-6555-3_8","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":18642,"journal":{"name":"Mikrochemie vereinigt mit Mikrochimica acta","volume":"1 1","pages":"167-182"},"PeriodicalIF":0.0000,"publicationDate":"1996-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"47","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Mikrochemie vereinigt mit Mikrochimica acta","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-7091-6555-3_8","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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