Improving the resolution of microscope by deconvolution after dense scan

Yaohua Xie
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引用次数: 1

Abstract

Super-resolution microscopes (such as STED) illuminate samples with a tiny spot, and achieve very high resolution. But structures smaller than the spot cannot be resolved in this way. Therefore, we propose a technique to solve this problem. It is termed “Deconvolution after Dense Scan (DDS)”. First, a preprocessing stage is introduced to eliminate the optical uncertainty of the peripheral areas around the sample’s ROI (Region of Interest). Then, the ROI is scanned densely together with its peripheral areas. Finally, the high resolution image is recovered by deconvolution. The proposed technique does not need to modify the apparatus much, and is mainly performed by algorithm. Simulation experiments show that the technique can further improve the resolution of super-resolution microscopes.
密扫后反褶积提高显微镜分辨率
超分辨率显微镜(如STED)用一个微小的斑点照亮样品,并获得非常高的分辨率。但是小于点的结构不能用这种方法解决。因此,我们提出一种技术来解决这个问题。它被称为“密集扫描后的反卷积(DDS)”。首先,引入预处理阶段以消除样品感兴趣区域周围周边区域的光学不确定性。然后,对感兴趣区域及其周边区域进行密集扫描。最后,通过反卷积恢复高分辨率图像。该方法不需要对仪器进行很大的修改,主要通过算法实现。仿真实验表明,该技术可以进一步提高超分辨显微镜的分辨率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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