Area minimization synthesis for reconfigurable single-electron transistor arrays with fabrication constraints

Yi-Hang Chen, Jian-Yu Chen, Juinn-Dar Huang
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引用次数: 12

Abstract

As fabrication processes exploit even deeper submicron technology, power dissipation has become a crucial issue for most electronic circuit and system designs nowadays. In particular, leakage power is becoming a dominant source of power consumption. Recently, the reconfigurable single-electron transistor (SET) array has been proposed as an emerging circuit design style for continuing Moore's Law due to its ultra-low power consumption. Several automated synthesis approaches have been developed for the reconfigurable SET array in the past few years. Nevertheless, all of those existing methods consider fabrication constraints, which are mandatory, merely in late synthesis stages. In this paper, we propose a synthesis algorithm, featuring both variable reordering and product term reordering, for area minimization. In addition, our algorithm takes those mandatory fabrication constraints into account in early stages for better outcomes. Experimental results show that our new method can achieve an area reduction of up to 24% as compared to current state-of-the-art techniques.
具有制造约束的可重构单电子晶体管阵列的面积最小化合成
随着制造工艺深入亚微米技术,功耗已成为当今大多数电子电路和系统设计的关键问题。特别是,泄漏功率正在成为电力消耗的主要来源。近年来,可重构单电子晶体管(SET)阵列因其超低功耗而成为延续摩尔定律的一种新兴电路设计方式。近年来,针对可重构SET阵列已经开发了几种自动化合成方法。然而,所有这些现有的方法考虑制造限制,这是强制性的,仅仅在后期合成阶段。在本文中,我们提出了一种同时具有变量重排序和乘积项重排序的面积最小化综合算法。此外,我们的算法在早期阶段考虑了这些强制性的制造约束,以获得更好的结果。实验结果表明,与目前最先进的技术相比,我们的新方法可以实现高达24%的面积缩小。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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