Polysilicon Fuse Electrical Voiding Mechanism AP/DFM: Advanced Patterning / Design for Manufacturability

Gang Liu, Rommel Relos, Bohumil Janik, Robert Davis, T. Myers, D. Allman, Jeff Hall, S. Vandeweghe, S. Menon, Ed Flanigan
{"title":"Polysilicon Fuse Electrical Voiding Mechanism AP/DFM: Advanced Patterning / Design for Manufacturability","authors":"Gang Liu, Rommel Relos, Bohumil Janik, Robert Davis, T. Myers, D. Allman, Jeff Hall, S. Vandeweghe, S. Menon, Ed Flanigan","doi":"10.1109/ASMC49169.2020.9185389","DOIUrl":null,"url":null,"abstract":"Products in automotive applications demand polysilicon fuse One-time programmable (OTP) solutions with extremely low failure rates. Fundamental understanding of the programming mechanism and key design/programming factors are indispensable to achieving such a goal. This paper presents a real-time poly fuse voiding model supported by electrical waveforms, simulations and physical analysis data. Impacts of fuse design and programming condition changes are also examined.","PeriodicalId":6771,"journal":{"name":"2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)","volume":"15 1","pages":"1-4"},"PeriodicalIF":0.0000,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASMC49169.2020.9185389","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Products in automotive applications demand polysilicon fuse One-time programmable (OTP) solutions with extremely low failure rates. Fundamental understanding of the programming mechanism and key design/programming factors are indispensable to achieving such a goal. This paper presents a real-time poly fuse voiding model supported by electrical waveforms, simulations and physical analysis data. Impacts of fuse design and programming condition changes are also examined.
多晶硅熔断器电气空化机构AP/DFM:可制造性的高级图样/设计
汽车应用中的产品需要多晶硅熔断器一次性可编程(OTP)解决方案,故障率极低。对编程机制和关键设计/编程因素的基本理解是实现这一目标不可或缺的。本文提出了一种以波形、仿真和物理分析数据为支撑的实时聚熔断模型。分析了熔断器设计和编程条件变化的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信