Determination of thickness oof dielectric material by microwave power measurement using X-band testbench

Abstract

Microwave power measurements are an established method of non-destructive testing of dielectric materials. The physical properties of uniform dielectric material can also be determined through such testing. The current work focuses on a method to determine the thickness of uniform homogeneous dielectric material through measurement of microwave power absorbed by the material using X-band microwave test bench with Gunn oscillator as the source of microwave power. Experiments using uniform homogeneous paper and rubber with standardized thicknesses have been carried out to plot the variation of microwave power absorbed by the dielectric materials with variation in thickness. The plots obtained in this manner can be used to find out the thickness of paper and rubber of similar composition and uniform thickness from the value of microwave power absorbed by them at the frequency at which the experiments have been carried out in the present work.