Estimation of prolonged lifetimes of excited states of neutral oxygen atom (OI) by time-resolved laser-induced breakdown spectroscopy (TR-LIBS)

A. Haider, N. Hoque, Arifur Rahaman, Zulfiqar Hasan Khan
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Abstract

Lifetimes of the upper states of excited oxygen atoms corresponding to transitions to the common lower state in the case of the emission lines around 777 nm and 844 nm have been estimated by measuring the line intensities as a function of the delay time between the Q-switching of the laser and the opening of the window of the ICCD. In the case of the emission line around 777 nm, resulting from the transitions from the three very closely spaced upper energy levels, 2s2 2p3 (4S0) 3p5P3 (777.194 nm), 2s2 2p3 (4S0) 3p5P2 (777.417 nm) and 2s2 2p3 (4S0) 3p5P1 (777.539 nm) to the common lower energy level 2s2 2p3 (4S0) 3s5S2, the lifetime was measured to be 253 ns. Similarly, in the case of the emission-line around 844 nm, resulting from the transitions from the three very closely spaced upper energy levels 2s2 2p3 (4S0) 3p3P0 (844.625 nm), 2s2 2p3 (4S0) 3p3P2 (844.636 nm) and 2s2 2p3 (4S0) 3p3P1 (844.676 nm) to the common lower energy level 2p3 (4S0) 3s3S1, the lifetime was measured to be 278 ns by this technique. The measured lifetimes in our experiment, for both 777 nm and 844 nm atomic transition lines of oxygen (O), are almost nine times higher than the theoretical value. Self-absorption and radiation trapping are possible mechanisms responsible for the mismatch between measured and intrinsic lifetimes. Last but not least, utilizing the TR-LIBS technique is yet another incredible application to estimate the prolonged lifetime of closely spaced excited states of an atom in the presence of self-absorption and radiation trapping. The average plasma cooling temperature (excitation temperature) lifetime was found to be 1183 ns, which is compatible with the previously reported values. J. Bangladesh Acad. Sci. 46(2); 175-183: December 2022
用时间分辨激光诱导击穿光谱(TR-LIBS)估计中性氧原子(OI)激发态延长寿命
在777nm和844nm发射谱线的情况下,通过测量谱线强度与激光调q到ICCD窗口打开之间的延迟时间的函数关系,估计了激发态氧原子跃迁到普通低态时的高态寿命。在777nm附近的发射谱线中,由三个间隔非常近的高能级,2s2 2p3 (4S0) 3p5P3 (777.194 nm), 2s2 2p3 (4S0) 3p5P2 (777.417 nm)和2s2 2p3 (4S0) 3p5P1 (777.539 nm)跃迁到共同的低能级2s2 2p3 (4S0) 3s5S2,测量到的寿命为253 ns。同样,在844 nm附近的发射线上,由三个非常紧密间隔的高能级2s2 2p3 (4S0) 3p3P0 (844.625 nm), 2s2 2p3 (4S0) 3p3P2 (844.636 nm)和2s2 2p3 (4S0) 3p3P1 (844.676 nm)跃迁到共同的低能级2p3 (4S0) 3s3S1,通过该技术测量的寿命为278 ns。在我们的实验中,氧(O)的777 nm和844 nm原子跃迁线的测量寿命几乎是理论值的9倍。自吸收和辐射捕获是造成测量寿命与固有寿命不匹配的可能机制。最后但并非最不重要的是,利用TR-LIBS技术是另一个令人难以置信的应用,用于估计在存在自吸收和辐射俘获的情况下原子紧密间隔激发态的延长寿命。等离子体的平均冷却温度(激发温度)寿命为1183 ns,与先前报道的值一致。科学通报46(2);175-183: 2022年12月
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