First adhesion measurements of conductive ultrananocrystalline diamond MEMS sidewalls

F. Buja, J. Kokorian, A. Sumant, W. V. Spengen
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引用次数: 1

Abstract

We present the first measuremenst of adhesion between two micro-electromechanical systems (MEMS) surfaces, fully fabricated with boron doped ultrananocrystalline diamond (B-UNCD). This research allows us to explore the potential of conductive UNCD MEMS for the solution of issues like adhesion and friction in micro-devices and describe with accuracy the effects involved. By means of standard lithographic techniques, we have fabricated a diamond micro thermal actuator (chevron type), which is used as a platform for tribological testing. A peculiar effect has been observed in the adhesion phenomenon of UNCD. It involves with high probability, an interaction between hydrocarbon/amorphous carbon layers (a-C) that cover the two diamond contacting surfaces. The as-etched device shows a `chewing-gum' effect in the adhesion curve, probably due to the formation of hydrocarbon/a-C chains after the interaction of the surfaces. This effect disappears when the device is treated in oxygen plasma and the hydrocarbon/a-C is removed. The study of this phenomenon will be followed by more accurate analysis and atomistic simulation and the results will be compared with nitrogen-incorporated UNCD (N-UNCD) fabricated devices.
首次测量导电超晶金刚石MEMS侧壁的附着力
我们提出了两个微机电系统(MEMS)表面之间粘附的第一个测量,完全由硼掺杂超晶金刚石(B-UNCD)制造。这项研究使我们能够探索导电UNCD MEMS在解决微器件中粘附和摩擦等问题方面的潜力,并准确描述所涉及的影响。通过标准的光刻技术,我们制作了一个金刚石微热致动器(v型),作为摩擦学测试的平台。在UNCD的附着现象中观察到一种特殊的效应。它很可能涉及覆盖两个金刚石接触面的碳氢化合物/非晶碳层(a-C)之间的相互作用。蚀刻后的器件在粘附曲线上显示出“口香糖”效应,这可能是由于表面相互作用后形成的碳氢化合物/a- c链。当设备在氧等离子体中处理并去除碳氢化合物/a-C时,这种效应消失。对这一现象的研究将进行更精确的分析和原子模拟,并将结果与氮掺杂UNCD (N-UNCD)制造的器件进行比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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