K. Fujiyama, K. Harada, A. Ogawa, Hirohisa Kimachi
{"title":"EBSD Analysis of Grain Strain Distribution for Creep Damaged SUS304HTB","authors":"K. Fujiyama, K. Harada, A. Ogawa, Hirohisa Kimachi","doi":"10.2472/JSMS.64.88","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":17366,"journal":{"name":"journal of the Japan Society for Testing Materials","volume":"14 1","pages":"88-93"},"PeriodicalIF":0.0000,"publicationDate":"2015-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"journal of the Japan Society for Testing Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.2472/JSMS.64.88","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}