Performance degradation and mitigation strategies of silver nanowire networks: a review

IF 8.1 2区 材料科学 Q1 MATERIALS SCIENCE, MULTIDISCIPLINARY
Peiyuan Guan, Renbo Zhu, Yanzhe Zhu, Fandi Chen, Tao Wan, Zhemi Xu, R. Joshi, Z. Han, Long Hu, Tom Wu, Yuerui Lu, Dewei Chu
{"title":"Performance degradation and mitigation strategies of silver nanowire networks: a review","authors":"Peiyuan Guan, Renbo Zhu, Yanzhe Zhu, Fandi Chen, Tao Wan, Zhemi Xu, R. Joshi, Z. Han, Long Hu, Tom Wu, Yuerui Lu, Dewei Chu","doi":"10.1080/10408436.2021.1941753","DOIUrl":null,"url":null,"abstract":"Abstract In view of the drawbacks of high-cost and inherent brittleness of indium tin oxide (ITO) based transparent electrodes, silver nanowires (AgNW) networks have been considered as promising alternatives owing to their excellent optical transparency, mechanical flexibility, and compatibility with large scale printing process. AgNWs have been applied as transparent electrodes in many electronic devices, however, in many cases, they inevitably interact with the surrounding media (e.g., temperature, electric field, UV light irradiation, etc.) which will cause performance degradation. For instance, AgNWs show a typical Rayleigh instability phenomenon when the external temperature is higher than a critical point. Moreover, a specific range of UV light or/and intensive current density can accelerate the partial breakage of AgNW networks. To develop highly stable AgNW based transparent electrodes for flexible electronic devices, intensive research works have been conducted to mitigate the degeneration issues. In this review, the degradation mechanisms of AgNW based transparent electrodes have been systematically studied. Furthermore, the mainstream strategies for mitigating the deterioration of AgNW based transparent electrodes have been analyzed. Finally, the present challenges in current materials processing, and future research directions have been discussed.","PeriodicalId":55203,"journal":{"name":"Critical Reviews in Solid State and Materials Sciences","volume":"10 1","pages":"435 - 459"},"PeriodicalIF":8.1000,"publicationDate":"2021-07-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"19","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Critical Reviews in Solid State and Materials Sciences","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1080/10408436.2021.1941753","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 19

Abstract

Abstract In view of the drawbacks of high-cost and inherent brittleness of indium tin oxide (ITO) based transparent electrodes, silver nanowires (AgNW) networks have been considered as promising alternatives owing to their excellent optical transparency, mechanical flexibility, and compatibility with large scale printing process. AgNWs have been applied as transparent electrodes in many electronic devices, however, in many cases, they inevitably interact with the surrounding media (e.g., temperature, electric field, UV light irradiation, etc.) which will cause performance degradation. For instance, AgNWs show a typical Rayleigh instability phenomenon when the external temperature is higher than a critical point. Moreover, a specific range of UV light or/and intensive current density can accelerate the partial breakage of AgNW networks. To develop highly stable AgNW based transparent electrodes for flexible electronic devices, intensive research works have been conducted to mitigate the degeneration issues. In this review, the degradation mechanisms of AgNW based transparent electrodes have been systematically studied. Furthermore, the mainstream strategies for mitigating the deterioration of AgNW based transparent electrodes have been analyzed. Finally, the present challenges in current materials processing, and future research directions have been discussed.
银纳米线网络的性能退化和缓解策略:综述
摘要针对氧化铟锡(ITO)透明电极的高成本和固有脆性的缺点,银纳米线(AgNW)网络因其优异的光学透明性、机械柔韧性和与大规模印刷工艺的相容性而被认为是一种有前途的替代方案。AgNWs已作为透明电极应用于许多电子器件中,但在许多情况下,它们不可避免地与周围介质(如温度、电场、紫外光照射等)相互作用,从而导致性能下降。例如,当外部温度高于某个临界点时,AgNWs表现出典型的瑞利不稳定现象。此外,特定范围的紫外光或/和强电流密度可以加速AgNW网络的部分断裂。为了开发高稳定的基于AgNW的柔性电子器件透明电极,人们进行了大量的研究工作来减轻退化问题。本文对AgNW基透明电极的降解机理进行了系统的研究。此外,还分析了缓解AgNW透明电极劣化的主流策略。最后,对当前材料加工面临的挑战和未来的研究方向进行了讨论。
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来源期刊
CiteScore
22.10
自引率
2.80%
发文量
0
审稿时长
3 months
期刊介绍: Critical Reviews in Solid State and Materials Sciences covers a wide range of topics including solid state materials properties, processing, and applications. The journal provides insights into the latest developments and understandings in these areas, with an emphasis on new and emerging theoretical and experimental topics. It encompasses disciplines such as condensed matter physics, physical chemistry, materials science, and electrical, chemical, and mechanical engineering. Additionally, cross-disciplinary engineering and science specialties are included in the scope of the journal.
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