Research on the influence of cover plate on structural reliability of the ceramic package for packaging SIP

Zhen-tao Yang, Bo Peng, Ling Gao
{"title":"Research on the influence of cover plate on structural reliability of the ceramic package for packaging SIP","authors":"Zhen-tao Yang, Bo Peng, Ling Gao","doi":"10.1109/ICEPT47577.2019.245260","DOIUrl":null,"url":null,"abstract":"During the reliability experiment, the stress will be transferred to the ceramic package through the elastic deformation of the cover plate, because of the large size of the cover plate of the ceramic package for system in package, resulting in an obvious stress concentration phenomenon on the side wall of the package. The reliability test of the ceramic package after sealed was simulated and analyzed by using the finite element method. the material and the structure of cover plate for influence on the package structure reliability was studied , analyzed the influence of different plate structure on the form and distribution of stress of the ceramic package, evaluated the cover plate structure on the influence of the package structure reliability. It provides a reliable theoretical basis for the design of the cover plate of this kind of package. The problems such as porcelain crack of package or device failure caused by cover plate deformation due to unreasonable cover plate design are avoided. Reasonable cover plate structure plays an important role in solving the failure problem in reliability test and improving the reliability of devices.","PeriodicalId":6676,"journal":{"name":"2019 20th International Conference on Electronic Packaging Technology(ICEPT)","volume":"44 1","pages":"1-4"},"PeriodicalIF":0.0000,"publicationDate":"2019-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 20th International Conference on Electronic Packaging Technology(ICEPT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEPT47577.2019.245260","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

During the reliability experiment, the stress will be transferred to the ceramic package through the elastic deformation of the cover plate, because of the large size of the cover plate of the ceramic package for system in package, resulting in an obvious stress concentration phenomenon on the side wall of the package. The reliability test of the ceramic package after sealed was simulated and analyzed by using the finite element method. the material and the structure of cover plate for influence on the package structure reliability was studied , analyzed the influence of different plate structure on the form and distribution of stress of the ceramic package, evaluated the cover plate structure on the influence of the package structure reliability. It provides a reliable theoretical basis for the design of the cover plate of this kind of package. The problems such as porcelain crack of package or device failure caused by cover plate deformation due to unreasonable cover plate design are avoided. Reasonable cover plate structure plays an important role in solving the failure problem in reliability test and improving the reliability of devices.
盖板对SIP封装陶瓷封装结构可靠性的影响研究
在可靠性实验过程中,由于系统用陶瓷封装的盖板尺寸较大,应力会通过盖板的弹性变形传递到陶瓷封装上,导致封装侧壁出现明显的应力集中现象。采用有限元法对陶瓷封装密封后的可靠性试验进行了仿真分析。研究了盖板材料和盖板结构对封装结构可靠性的影响,分析了不同盖板结构对陶瓷封装应力形态和分布的影响,评价了盖板结构对封装结构可靠性的影响。为该类包装盖板的设计提供了可靠的理论依据。避免了由于盖板设计不合理导致的盖板变形造成的包装瓷裂或器件失效等问题。合理的盖板结构对解决可靠性试验中的失效问题,提高设备的可靠性具有重要作用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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