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Leakage in CMOS Nanometric Technologies

Proceedings of the 2007 international symposium on Low power electronics and design (ISLPED '07) Pub Date : 2018-10-03 DOI:10.1201/9781315220710-3
Olivier Ferré, J. Figueras
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CMOS纳米技术中的泄漏
本文章由计算机程序翻译，如有差异，请以英文原文为准。
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Proceedings of the 2007 international symposium on Low power electronics and design (ISLPED '07)
Proceedings of the 2007 international symposium on Low power electronics and design (ISLPED '07)
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