Synthesis of Mos2/ws2Vertical Heterostructure and Its Photoelectric Properties

Xin Lin, F. Wang, Jiaqiang Shen, Xichao Di, Huanhuan Di, Meng Yan, Kailiang Zhang
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Abstract

Two-dimensional (2D) heterostructures based on transition metal dichalcogenides have sparked significant attention due to their excellent electrical and optical properties. However, synthesis of heterojunction is still a challenge. In this work, Mos2/ws2vertical heterostructure was achieved on SiO2/Si substrate via transferring CVD-grown Mos2 onto WS2. The morphology and structure properties of the Mos2/ws2heterostructure were characterized by optical microscope (OM), atomic force microscope (AFM), scanning electron microscope (SEM), Raman spectroscopy. Compared with individual Mos2 or WS2, the slight offset of the Raman peaks in the Mos2/ws2heterostructure was observed, which implies the charge transfer of the heterojunction. A photodetector based on Mos2/ws2heterostructure was fabricated with a channel length of 2μm. High on/off ratio (>107) and electron mobility of 10 cm2V−1S−1 of the photodetector were achieved. This work plays an active role in the development of photoelectronic devices based on 2D heterostructures.
Mos2/ws2垂直异质结构的合成及其光电性能
基于过渡金属二硫族化合物的二维异质结构由于其优异的电学和光学性质而引起了人们的广泛关注。然而,异质结的合成仍然是一个挑战。在这项工作中,通过将cvd生长的Mos2转移到WS2上,在SiO2/Si衬底上实现了Mos2/ WS2垂直异质结构。采用光学显微镜(OM)、原子力显微镜(AFM)、扫描电镜(SEM)、拉曼光谱(Raman spectroscopy)等表征了Mos2/ws2异质结构的形貌和结构特性。与单独的Mos2或WS2相比,在Mos2/ WS2异质结构中观察到拉曼峰的轻微偏移,这意味着异质结的电荷转移。制备了Mos2/ws2异质结构的光电探测器,通道长度为2μm。实现了高开/关比(>107)和10 cm2V−1S−1的电子迁移率。这项工作对基于二维异质结构的光电子器件的发展具有积极的作用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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