Excellent photonic-assisted measurement system for high order mode pattern scan in reactive near field

Abstract

We present experimental results of TE6,2 mode electric field pattern results utilizing a photonic-assisted W-band measurement system and a vector network analyzer (VNA) system in the reactive near field region. We introduce the photonic-assisted W-band measurement system and demonstrate that it provides extremely precise probing capability compared to the VNA system, especially when a higher order mode pattern is scanned in the extreme near field region.