S. Pearton, Jiancheng Yang, Patrick H. Cary, F. Ren, J. Kim
{"title":"Radiation damage in Ga2O3","authors":"S. Pearton, Jiancheng Yang, Patrick H. Cary, F. Ren, J. Kim","doi":"10.1016/B978-0-12-814521-0.00014-2","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":12671,"journal":{"name":"Gallium Oxide","volume":"9 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Gallium Oxide","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1016/B978-0-12-814521-0.00014-2","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
京公网安备 11010802042870号
求助内容：
应助结果提醒方式：
