The output signal of the broadband differential interferometer as a function of the thickness of the single-mode optical waveguide

IF 2.3 4区物理与天体物理 Q2 OPTICS

Fiber and Integrated Optics Pub Date : 2019-09-13 DOI:10.1117/12.2536658

K. Gut

引用次数: 1

Abstract

The paper presents an analysis of planar broadband waveguide interferometers in the case of a change in layer thickness. The analysis was performed for the wavelength range of 450nm-1200nm. The TE0 and TM0 orthogonal modes which propagate in this wavelength range are considered. At the output of the system, an interference signal behind a polarizer can be recorded. If a spectrometer is used as a detector, the recorded signal is a function of the wavelength. Change in the change thickness of the waveguide layers results in a change of the recorded signal shape.

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宽带差分干涉仪的输出信号与单模光波导厚度的关系

本文对平面宽带波导干涉仪在层厚变化的情况下进行了分析。分析的波长范围为450nm-1200nm。考虑了在该波长范围内传播的TE0和TM0正交模。在系统的输出端，可以记录偏振器后面的干扰信号。如果用光谱仪作为探测器，记录的信号是波长的函数。波导层厚度的变化导致记录信号形状的变化。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Fiber and Integrated Optics 物理-光学

CiteScore

3.40

自引率

0.00%

发文量

审稿时长

>12 weeks

期刊介绍： Fiber and Integrated Optics , now incorporating the International Journal of Optoelectronics, is an international bimonthly journal that disseminates significant developments and in-depth surveys in the fields of fiber and integrated optics. The journal is unique in bridging the major disciplines relevant to optical fibers and electro-optical devices. This results in a balanced presentation of basic research, systems applications, and economics. For more than a decade, Fiber and Integrated Optics has been a valuable forum for scientists, engineers, manufacturers, and the business community to exchange and discuss techno-economic advances in the field.