The peculiarity of capacitance-voltage characteristics of the metal-insulator-nanowire structure

S. Petrosyan, S. Nersesyan
{"title":"The peculiarity of capacitance-voltage characteristics of the metal-insulator-nanowire structure","authors":"S. Petrosyan, S. Nersesyan","doi":"10.15407/spqeo25.03.289","DOIUrl":null,"url":null,"abstract":"The quasi-static capacitance-voltage characteristics of the metal-insulator-nanowire structure have been theoretically studied with account of the surface states at the nanowire-insulator interface. At small radii, possible is the case when the entire bulk of nanowire is depleted before the onset of inversion of the conduction type near the surface will occur. In this case, there is a strong deviation of the capacitance-voltage characteristic from that in the standard MIS structure: with increasing voltage, the capacitance of the structure tends not to a constant value equal to the capacitance of the dielectric layer, but to zero.","PeriodicalId":21598,"journal":{"name":"Semiconductor physics, quantum electronics and optoelectronics","volume":"13 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2022-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Semiconductor physics, quantum electronics and optoelectronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.15407/spqeo25.03.289","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

The quasi-static capacitance-voltage characteristics of the metal-insulator-nanowire structure have been theoretically studied with account of the surface states at the nanowire-insulator interface. At small radii, possible is the case when the entire bulk of nanowire is depleted before the onset of inversion of the conduction type near the surface will occur. In this case, there is a strong deviation of the capacitance-voltage characteristic from that in the standard MIS structure: with increasing voltage, the capacitance of the structure tends not to a constant value equal to the capacitance of the dielectric layer, but to zero.
金属-绝缘体-纳米线结构电容-电压特性的特殊性
从理论上研究了金属-绝缘子-纳米线结构的准静态电容-电压特性,并考虑了纳米线-绝缘子界面的表面状态。在小半径的情况下,在表面附近的传导类型反转发生之前,可能会出现整个纳米线耗尽的情况。在这种情况下,电容电压特性与标准MIS结构的电容电压特性存在较大偏差:随着电压的增加,结构的电容不再趋向于等于介电层电容的恒定值,而是趋于零。
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