X. Bai, R. Nebashi, M. Miyamura, Kazunori Funahashi, N. Banno, K. Okamoto, Hideaki Numata, N. Iguchi, T. Sugibayashi, T. Sakamoto, M. Tada
{"title":"28nm Atom-Switch FPGA: Static Timing Analysis and Evaluation","authors":"X. Bai, R. Nebashi, M. Miyamura, Kazunori Funahashi, N. Banno, K. Okamoto, Hideaki Numata, N. Iguchi, T. Sugibayashi, T. Sakamoto, M. Tada","doi":"10.1587/transele.2021fus0005","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":13259,"journal":{"name":"IEICE Trans. Electron.","volume":"36 1","pages":"627-630"},"PeriodicalIF":0.0000,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEICE Trans. Electron.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1587/transele.2021fus0005","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}