Jinseok Kim, Jongeun Koo, Taesu Kim, Yulhwa Kim, Hyungjun Kim, Seunghyun Yoo, Jae-Joon Kim
{"title":"Area-Efficient and Variation-Tolerant In-Memory BNN Computing using 6T SRAM Array","authors":"Jinseok Kim, Jongeun Koo, Taesu Kim, Yulhwa Kim, Hyungjun Kim, Seunghyun Yoo, Jae-Joon Kim","doi":"10.23919/VLSIC.2019.8778160","DOIUrl":null,"url":null,"abstract":"We introduce a SRAM-based binary neural network (BNN) hardware which uses a single 6T SRAM cell for XNOR operation for the first time. The cell is 45% smaller than the previous 8T bitcell for XNOR operation. We also propose an in-memory calibration and batch normalization to achieve more reliable operation under the presence of process variation.","PeriodicalId":6707,"journal":{"name":"2019 Symposium on VLSI Circuits","volume":"5 1","pages":"C118-C119"},"PeriodicalIF":0.0000,"publicationDate":"2019-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"41","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 Symposium on VLSI Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/VLSIC.2019.8778160","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 41
Abstract
We introduce a SRAM-based binary neural network (BNN) hardware which uses a single 6T SRAM cell for XNOR operation for the first time. The cell is 45% smaller than the previous 8T bitcell for XNOR operation. We also propose an in-memory calibration and batch normalization to achieve more reliable operation under the presence of process variation.