{"title":"Temperature resolved X-ray diffraction as a tool of thermal analysis","authors":"W. Engel, N. Eisenreich, M. Herrmann, V. Kolarik","doi":"10.1007/BF01996790","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":17333,"journal":{"name":"Journal of thermal analysis","volume":"81 1","pages":"1025-1037"},"PeriodicalIF":0.0000,"publicationDate":"1997-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of thermal analysis","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/BF01996790","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
