{"title":"Error prediction and detection methodologies for reliable circuit operation under NBTI","authors":"Julio Vazquez Hernandez","doi":"10.1109/TEST.2014.7035364","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":6403,"journal":{"name":"2007 IEEE International Test Conference","volume":"71 1","pages":"1-10"},"PeriodicalIF":0.0000,"publicationDate":"2014-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2014.7035364","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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