Abhishek Hanchate, Parth Sanjaybhai Dave, Ankur Verma, Akash Tiwari, Cyan Subhra Mishra, S. Kumara, Anil Srivastava, Hui Yang, Vijaykrishnan Narayanan, John Sampson, M. Kandemir, K. Lee, Tanna Pugh, A. Jorden, Gautam Natarajan, D. Sagapuram, S. Bukkapatnam
{"title":"A Graphical Representation of Sensor Mapping for Machine Tool Fault Monitoring and Prognostics for Smart Manufacturing","authors":"Abhishek Hanchate, Parth Sanjaybhai Dave, Ankur Verma, Akash Tiwari, Cyan Subhra Mishra, S. Kumara, Anil Srivastava, Hui Yang, Vijaykrishnan Narayanan, John Sampson, M. Kandemir, K. Lee, Tanna Pugh, A. Jorden, Gautam Natarajan, D. Sagapuram, S. Bukkapatnam","doi":"10.1520/ssms20220031","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":51957,"journal":{"name":"Smart and Sustainable Manufacturing Systems","volume":null,"pages":null},"PeriodicalIF":0.8000,"publicationDate":"2023-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Smart and Sustainable Manufacturing Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1520/ssms20220031","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, MANUFACTURING","Score":null,"Total":0}