Application of X-ray computed tomography in silicon solar cells

Abstract

The present study outlines the characterization of the internal microstructure in a multicrystalline silicon solar cell, by means of a powerful non-intrusive experimental method, namely X-ray computed tomography. The purpose of this research is to give a better understanding of the silicon solar cells metallization layers and defects related to its processing. Resulting tomographic images showed the distribution of bismuth glass and porosity in Al and Ag contact layers. At the same time, 3D tomographic images revealed the presence of process induced defects. In this work the usefulness of the CT technique for the in depth study of silicon solar cells is shown.