Present and Future of Nanomechanics by Atomic Force Microscope

Hyomen Kagaku Pub Date : 2017-01-01 DOI:10.1380/jsssj.38.520
K. Nakajima, Makiko Ito, X. Liang, K. Matsue
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Abstract

Nanomechanics based on atomic force microscope (AFM) is reviewed. Tapping-mode phase imaging gives information of energy dissipative process during the contact between AFM probe and elastic or viscoelastic surface, which includes adhesive interaction as well as viscoelastic loss. The understanding of time-temperature superposition principle is crucial to interpret the data correctly. AFM nanomechanics based on “ slow ” force-distance curve analysis can also offer a lot of insights on materials ʼ mechanical properties. Young ʼ s modulus, adhesive force and viscoelastic work can be imaged. The paper devotes AFM analysis of block copolymer-type thermoplastic elastomer, in order to interconnect nanoscopic information and macroscopic mechanical properties evaluation, in which a new mathematical approach, computational homology may play an important role.
原子力显微镜下纳米力学的现状与未来
综述了基于原子力显微镜的纳米力学。轻敲式相位成像给出了AFM探针与弹性或粘弹性表面接触过程中的能量耗散过程,包括粘接相互作用和粘弹性损失。对时间-温度叠加原理的理解是正确解释数据的关键。基于“慢”力-距离曲线分析的AFM纳米力学也可以为材料的力学性能提供很多见解。杨氏模量、粘合力和粘弹性功可以成像。本文对嵌段共聚物型热塑性弹性体进行了AFM分析,以期将纳米尺度的信息与宏观力学性能的评价联系起来,在这一新的数学方法中,计算同源性可能发挥重要作用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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