{"title":"Design of ESD protection device using statistical methods","authors":"N. Shigyo, H. Kawashima, S. Yasuda","doi":"10.1109/ISQED.2002.996769","DOIUrl":null,"url":null,"abstract":"This paper describes an ESD protection device design to minimize its area A/sub p/ while maintaining the breakdown voltage V/sub ESD/. Hypothesis tests were performed to find the applied surge condition and to select control factors for the design-of-experiments (DOE). Also, TCAD was used to estimate V/sub ESD/. An optimum device structure, where a salicide block was employed, was found using statistical methods and TCAD.","PeriodicalId":20510,"journal":{"name":"Proceedings International Symposium on Quality Electronic Design","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2002-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings International Symposium on Quality Electronic Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2002.996769","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper describes an ESD protection device design to minimize its area A/sub p/ while maintaining the breakdown voltage V/sub ESD/. Hypothesis tests were performed to find the applied surge condition and to select control factors for the design-of-experiments (DOE). Also, TCAD was used to estimate V/sub ESD/. An optimum device structure, where a salicide block was employed, was found using statistical methods and TCAD.