Numerical Study of Silicon and Tungsten Diselenide Nanomaterial‐Based Surface Plasmon Resonance Sensor for Refractive Index Sensing

Annu Yadav, P. Lohia, Sachin Singh, S. Yadav, A. Mishra, D. K. Dwivedi
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Abstract

A Kretschmann configuration‐based surface plasmon resonance sensor is proposed. The sensor is made up of calcium fluoride prism, silver, silicon, and tungsten di selenide nanolayer. The theoretical and numerical study of surface plasmon resonance sensor is analyzed by angle interrogation method with the help of MATLAB 2017b. The transfer matrix method (TMM) is the foundation for simulation and a monochromatic light of wavelength 633 nm is considered as source. In the proposed device structure, each layer is arranged in vertical format to improve the electrical and optical properties. The refractive index for analyte is considered as 1.330 to 1.335. Silver (Ag) metal is used for the generation of surface plasmons. It has good chemical properties like metallic conductivity, chemical stability, bandgap, small work function, and acts as an adhesive layer between calcium fluoride prism and silicon layer. To improve the molecular contact and absorption, the transition metal dichalcogenide nanofilm tungsten di selenide (WSe2) is applied at the top. The sensitivity of 367.4 deg RIU−1, detection accuracy of 0.4169 deg−1, quality factor of 193.58, and full‐width half maximum of 1.8985 deg are obtained optimized performance parameters of the proposed device structure.
折射率传感用硅钨二硒化纳米材料表面等离子体共振传感器的数值研究
提出了一种基于克雷茨曼构形的表面等离子体共振传感器。该传感器由氟化钙棱镜、银、硅和二硒化钨纳米层组成。借助MATLAB 2017b,采用角度询问法对表面等离子体共振传感器的理论和数值研究进行了分析。以波长为633 nm的单色光为光源,以传递矩阵法(TMM)为模拟基础。在所提出的器件结构中,每层以垂直格式排列以改善电学和光学性能。分析物的折射率为1.330 ~ 1.335。银(Ag)金属用于产生表面等离子体。具有金属导电性好、化学稳定性好、带隙大、功函数小等化学性能,是氟化钙棱镜与硅层之间的粘接层。为了改善分子接触和吸收,在顶部采用过渡金属二硫系二硒化钨(WSe2)纳米膜。优化后的器件结构性能参数灵敏度为367.4°RIU−1,检测精度为0.4169°g−1,品质因子为193.58,全宽半最大值为1.8985°。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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