ON THE CAPACITY OF POROUS ALUMINUM OXIDE LAYERS

A. Dekker, Helen M. A. Urquhart
{"title":"ON THE CAPACITY OF POROUS ALUMINUM OXIDE LAYERS","authors":"A. Dekker, Helen M. A. Urquhart","doi":"10.1139/CJR50B-065","DOIUrl":null,"url":null,"abstract":"Porous aluminum oxide layers may be obtained by anodic oxidation in sulphuric acid. The base of the pores is separated from the metal by a thin insulating barrier layer. The experiments show that the ultimate thickness of the barrier layer remains constant after a critical value has been reached. The dependence of the final thickness on current density, concentration, and temperature has been investigated. It is suggested that an electronic current is involved in the mechanism which limits the growth of the barrier layer.","PeriodicalId":9392,"journal":{"name":"Canadian journal of research","volume":"97 1","pages":"541-550"},"PeriodicalIF":0.0000,"publicationDate":"1950-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Canadian journal of research","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1139/CJR50B-065","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

Porous aluminum oxide layers may be obtained by anodic oxidation in sulphuric acid. The base of the pores is separated from the metal by a thin insulating barrier layer. The experiments show that the ultimate thickness of the barrier layer remains constant after a critical value has been reached. The dependence of the final thickness on current density, concentration, and temperature has been investigated. It is suggested that an electronic current is involved in the mechanism which limits the growth of the barrier layer.
多孔氧化铝层的容量研究
多孔氧化铝层可通过在硫酸中阳极氧化得到。孔的底部由一层薄的绝缘阻挡层与金属隔开。实验表明,障层的极限厚度在达到一个临界值后保持不变。研究了最终厚度与电流密度、浓度和温度的关系。认为电子电流参与了限制势垒层生长的机制。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信