Spectroscopic ellipsometry of amorphous Ni0.95Tb0.05 and crystalline nickel

Abstract

Spectroscopic ellipsometry was used to determine the pseudodielectric constants of thin film sputtered crystalline nickel and the concentrated amorphous Ni_0.95Tb_0.05 alloy. The variation in ϵ₂(ω)/λ, which indicates the matrix element weighted joint density of states, is found to be relatively similar for both crystalline and amorphous systems. This is interpreted in terms of related short-range order and similar d band states in both these materials.