Chang-Ju Lee, Gyo-hun Koo, Dong‐Seok Kim, J. Yun, Jung-Hee Lee, S. Hahm
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引用次数: 0
Abstract
We examined the AlGaN buffer layer dependent photo-response characteristics of the metal-semiconductor-metal (MSM) UV photodetectors (PDs). In the AlGaN buffer layer PD sample, the peak photo-current was of 4.5 µA at 5 V for 365 nm and dark current level ws 4 pA at 1 V. The UV/visible rejection ratio of AlGaN buffer sample was higher than 104 and HT-GaN/LT-AlN sample was 102 at 1 V, respectively. We observed a UV-A selective (or band-pass-like) response behavior near the 360∼370 nm range.