A THz measurement platform design for 0.2–1.1THz

2015 40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz) Pub Date : 2015-11-12 DOI:10.1109/IRMMW-THZ.2015.7327432

Haotian Zhu, Q. Xue

引用次数: 5

Abstract

A precise and stable THz Measurement Platform is proposed in this paper. The displacement precision and angle precision of the platform are 0.02mm and 1° respectively. With OML or VDI extension module and Agilent N5245A PNA-X network analyzer, the THz Measurement Platform can measure waveguide components and antennas precisely in 0.2-1.1THz.

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一种0.2 ~ 1.1太赫兹测量平台设计

本文提出了一种精密稳定的太赫兹测量平台。平台的位移精度为0.02mm，角度精度为1°。通过OML或VDI扩展模块和安捷伦N5245A PNA-X网络分析仪，太赫兹测量平台可以在0.2-1.1太赫兹范围内精确测量波导元件和天线。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2015 40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz)

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