A DEVICE-LIFE MODEL FOR RELIABILITY DEMONSTRATION TEST FOR A PRODUCT MADE UP OF A LARGE ARRAY OF ELECTRONIC DEVICES

IF 1.3 Q4 COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE

International Journal of Innovative Computing Information and Control Pub Date : 2021-02-01 DOI:10.24507/IJICIC.17.01.167

C. Kang

引用次数: 0

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一种用于由大量电子设备组成的产品的可靠性演示试验的设备寿命模型

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

International Journal of Innovative Computing Information and Control 工程技术-计算机：人工智能

CiteScore

3.20

自引率

20.00%

发文量

审稿时长

4.3 months

期刊介绍： The primary aim of the International Journal of Innovative Computing, Information and Control (IJICIC) is to publish high-quality papers of new developments and trends, novel techniques and approaches, innovative methodologies and technologies on the theory and applications of intelligent systems, information and control. The IJICIC is a peer-reviewed English language journal and is published bimonthly