{"title":"Testing of Bulk Radiation Damage of n-in-p Silicon Sensors for Very High Radiation Environments","authors":"K. Hara, Z. Li, A. Affolder","doi":"10.1016/J.NIMA.2010.04.090","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":100971,"journal":{"name":"Nuclear Instruments and Methods","volume":"28 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2010-04-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"40","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nuclear Instruments and Methods","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1016/J.NIMA.2010.04.090","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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