EUV LITHOGRAPHY FOR SEMICONDUCTOR MANUFACTURING AND NANOFABRICATION

H. Kinoshita
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Abstract

EUV lithography is the exposure technology in which even 15 nm node which is the limit of Si device can be achieved. Unlike the conventional optical lithography, this technology serves as a reflection type optical system, and a multilayer coated mirror is used. Development of manufacturing equipment is accelerated to aim at the utilization starting from 2011. The critical issues of development are the EUV light source which has the power over 115 W and resist with high sensitivity and low line edge roughness (LER).
用于半导体制造和纳米制造的极紫外光刻技术
EUV光刻是一种曝光技术,它甚至可以达到Si器件极限的15nm节点。与传统的光学光刻不同,该技术是一种反射式光学系统,使用多层涂层反射镜。从2011年开始,加快生产设备的开发,以利用为目标。开发的关键问题是功率超过115 W的EUV光源,具有高灵敏度和低线边缘粗糙度(LER)。
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