The use of applied electric fields the photorefractive tungsten bronze ferroelectrics

N. Bei, G. Duree, G. Salamo, R. Kapoor, E. Sharp, R. Neurgaonkar
{"title":"The use of applied electric fields the photorefractive tungsten bronze ferroelectrics","authors":"N. Bei, G. Duree, G. Salamo, R. Kapoor, E. Sharp, R. Neurgaonkar","doi":"10.1109/ISAF.1994.522450","DOIUrl":null,"url":null,"abstract":"The traditional method of determining the photorefractive effective charge density is to plot the photorefractive space charge field versus the crossing angle in a two-beam coupling experiment. The difficulty with this traditional measurement technique is that the apparatus must be moved several times in order to obtain data over the sufficient number of crossing angles needed for an accurate fit with theory. Moreover, with small crossing angles the overlap between the two crossing beams can easily extend over the entire crystal, while with larger crossing angles the overlap between the two beams becomes less certain. In this paper we demonstrate an alternative method of determining the photorefractive charge density. In this approach we measure the phase shift between the optical intensity pattern in the crystal and the resulting index pattern, as a function of the magnitude of an applied d.c. field. By comparing the measured value of the d.c. field which produces a minimum phase shift with that predicted by theory the photorefractive effective charge density is found. In this case, only the magnitude of the applied field is varied and the apparatus remains fixed. The result is obtained quickly and with little error.","PeriodicalId":20488,"journal":{"name":"Proceedings of 1994 IEEE International Symposium on Applications of Ferroelectrics","volume":"60 1","pages":"633-635"},"PeriodicalIF":0.0000,"publicationDate":"1994-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1994 IEEE International Symposium on Applications of Ferroelectrics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISAF.1994.522450","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

The traditional method of determining the photorefractive effective charge density is to plot the photorefractive space charge field versus the crossing angle in a two-beam coupling experiment. The difficulty with this traditional measurement technique is that the apparatus must be moved several times in order to obtain data over the sufficient number of crossing angles needed for an accurate fit with theory. Moreover, with small crossing angles the overlap between the two crossing beams can easily extend over the entire crystal, while with larger crossing angles the overlap between the two beams becomes less certain. In this paper we demonstrate an alternative method of determining the photorefractive charge density. In this approach we measure the phase shift between the optical intensity pattern in the crystal and the resulting index pattern, as a function of the magnitude of an applied d.c. field. By comparing the measured value of the d.c. field which produces a minimum phase shift with that predicted by theory the photorefractive effective charge density is found. In this case, only the magnitude of the applied field is varied and the apparatus remains fixed. The result is obtained quickly and with little error.
应用外加电场制备光折变钨青铜铁电体
测定光折变有效电荷密度的传统方法是在双光束耦合实验中绘制光折变空间电荷场与交叉角的关系图。这种传统测量技术的困难在于,为了获得与理论精确拟合所需的足够数量的交叉角的数据,仪器必须移动几次。此外,当交叉角较小时,两束交叉光束之间的重叠可以很容易地扩展到整个晶体上,而当交叉角较大时,两束光束之间的重叠变得不那么确定。在本文中,我们展示了一种测定光折变电荷密度的替代方法。在这种方法中,我们测量了晶体中的光强模式和由此产生的折射率模式之间的相移,作为施加直流场大小的函数。将产生最小相移的直流电场的实测值与理论预测值进行比较,得到了光折变有效电荷密度。在这种情况下,只有外加电场的大小变化,仪器保持固定。结果得到的速度快,误差小。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信