FeFET device structure design and analysis for low power circuit applications

Mandeep Singh, T. Chaudhary, B. Raj
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Abstract

This paper discusses the analysis of FeFET for low-power applications. The persistent scaling of computer capacity is necessary to handle the data's rapidly rising volume and complexity. CMOS technology's opportunities are shrinking as transistor size reduction approaches physical constraints. The new nanotechnologies have ability to replace the currently used CMOS and other technologies in energy-efficient computer devices. For information systems, ferroelectric FETs (FeFETs) are a potential candidate to continue improving power consumption. The FeFET analysis is carried out by evaluating drain current, transconductance, electric field, acceptor concentrations, and electric potential. Due to their energy, area efficiency and combined logic-memory functions, FeFETs, at the edge of semiconductor technology, are capable of meeting the requirements of integrated data computer applications. The proposed FeFET device has high ON current and small OFF current. The device exhibits a sub-threshold slope of 9.3 mV/dec, and the threshold voltage of 0.26 V. The proposed structure of FeFET is designed and simulated using the Silvaco TCAD tool. Proposed FeFET devices provides high-density and low-power circuit applications and would act as a promising candidate for the scientific and research community working in this area.
FeFET器件结构设计及低功耗电路应用分析
本文讨论了低功率应用中效应场效应管的分析。计算机容量的持续扩展对于处理快速增长的数据量和复杂性是必要的。由于晶体管尺寸缩小接近物理限制,CMOS技术的机会正在缩小。新的纳米技术有能力取代目前使用的CMOS和其他技术在节能计算机设备。对于信息系统,铁电场效应管(fefet)是一个潜在的候选人,以继续提高功耗。效应场效应分析是通过评估漏极电流、跨导、电场、受体浓度和电势来进行的。由于其能量,面积效率和组合的逻辑存储功能,效应场效应管,在半导体技术的边缘,能够满足集成数据计算机应用的要求。该器件具有高导通电流和小关断电流。该器件的亚阈值斜率为9.3 mV/dec,阈值电压为0.26 V。利用Silvaco TCAD工具对所提出的ffet结构进行了设计和仿真。提出的ffet器件提供高密度和低功耗电路应用,并将作为在该领域工作的科学和研究界的有前途的候选人。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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