Highly Accurate Thickness Determination of 2D Materials (Crystal Research and Technology 6/2021)

IF 1.5 4区材料科学 Q3 CRYSTALLOGRAPHY

Crystal Research and Technology Pub Date : 2021-06-01 DOI:10.1002/crat.202170020

引用次数: 1

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高精度二维材料厚度测定(晶体研究与技术6/2021)

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Crystal Research and Technology 化学-晶体学

自引率

6.70%

发文量

121

审稿时长

1.9 months

期刊介绍： The journal Crystal Research and Technology is a pure online Journal (since 2012). Crystal Research and Technology is an international journal examining all aspects of research within experimental, industrial, and theoretical crystallography. The journal covers the relevant aspects of -crystal growth techniques and phenomena (including bulk growth, thin films) -modern crystalline materials (e.g. smart materials, nanocrystals, quasicrystals, liquid crystals) -industrial crystallisation -application of crystals in materials science, electronics, data storage, and optics -experimental, simulation and theoretical studies of the structural properties of crystals -crystallographic computing