{"title":"Analysis of higher-order N-tone sigma-delta modulators for ultra wideband communications","authors":"K. Chang, G. Sobelman, E. Saberinia, A. Tewfik","doi":"10.1109/ISCAS.2004.1328953","DOIUrl":null,"url":null,"abstract":"We consider the properties of a class of non-oversampling N-tone sigma-delta modulators which have applications in the design of UWB-OFDM communications systems. The spectrum gaps that exist in such systems are well-matched to the noise shaping properties of these modulators and their non-oversampling nature makes them practical for use with these ultra wideband signals. Performance results for first-order, second-order and L/sup th/-order modulators are presented, and a general expression for the excess resolution that can be gained in such systems is obtained.","PeriodicalId":6445,"journal":{"name":"2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512)","volume":"411 1","pages":"IV-113"},"PeriodicalIF":0.0000,"publicationDate":"2004-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISCAS.2004.1328953","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
We consider the properties of a class of non-oversampling N-tone sigma-delta modulators which have applications in the design of UWB-OFDM communications systems. The spectrum gaps that exist in such systems are well-matched to the noise shaping properties of these modulators and their non-oversampling nature makes them practical for use with these ultra wideband signals. Performance results for first-order, second-order and L/sup th/-order modulators are presented, and a general expression for the excess resolution that can be gained in such systems is obtained.